JIS

Measurement methods of polarization resistance of copper alloy tubes for condenser (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1993

Method of alkaline salt corrosion testing for magnesium and magnesium alloys (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2003

Methods for determining average grain size of magnesium alloy sheets (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2008

Testing methods of resistivity for germanium (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1962

Measurement of minority carrier life time in germanium by photoconductive decay method (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1978

Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1995

Method of measurement of etch pit density of germanium crystal (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1966

Methods for determination of copper in copper and copper alloys
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005

Methods for determination of arsenic in copper and copper alloys
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005

Method for determination of selenium in copper and copper alloys (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2006

Methods for determination of cadmium in copper and copper alloys
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1997

Methods for determination of cadmium in copper and copper alloys (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2006