Description
Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques (Withdrawn 2003)
Product Details
- Published:
- 12/10/2002
- Number of Pages:
- 8
- File Size:
- 1 file , 520 KB
ASTM F847-02
$29.00
Sale!
-50%
-50%
ASTM F847-02
$29.00
Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques (Withdrawn 2003)
standard by ASTM International, 12/10/2002
