Description

This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published:

04/22/2020

ISBN(s):

9780580991981

Number of Pages:

24

File Size:

1 file , 1.6 MB

Product Code(s):

30363345, 30363345, 30363345