CIE x036:2010

$101.76

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CIE x036:2010

$101.76

Proceedings of CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry (30-31 August 2010, Bern, Switzerland)
Conference Proceeding by Commission Internationale de L'Eclairage, 12/01/2010

Category:

Description

This Symposium was organised by CIE Division 2 in cooperation with the SwissLighting Society (SLG), and was hosted by the Federal Office of Metrology (METAS),Bern, Switzerland. The two-day Symposium included a one day tutorial presentingthe state-of-the-art techniques in the field of photometry. On the second day, aScientific Symposium featured 35 contributed papers presenting recent research inphotometry, colorimetry, and radiometry with a focus on the methods using spectraland imaging techniques. The Symposium had four sessions, Session I:Goniophotometry and Spatial Methods, Session II: Imaging and Spectral Methods,Session III: Metrology for LEDs, and Session IV: Advances in Radiometry.

Product Details

Published:
12/01/2010
ISBN(s):
9783901906893
Number of Pages:
163
File Size:
1 file , 8.7 MB