Description
Product Details
- Published:
- 01/01/2010
- File Size:
- 1 file , 630 KB
JIS C 2162:2010
$24.50
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JIS C 2162:2010
$24.50
Test method of long-term reliability of gate insulator for SiC devices at high temperature (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010
