JIS Z 4334:2005

$29.00

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JIS Z 4334:2005

$29.00

Reference sources for the calibration of surface contamination monitors — Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005

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Published:
01/01/2005
File Size:
1 file , 810 KB